|
Modeling 3D NAND Flash with Nonparametric Inference on Regression Coefficients for Reliable Solid-State Storage
Borghesi, Michela; Zambelli, Cristian; Micheloni, Roberto; Bonnini, Stefano
dettagli >>
|
FUTURE INTERNET
Vol. 15, No. 10, pp: 1-13, Anno: 2023 |
|
|
|
|
Process-Voltage-Temperature Variations Assessment in Energy-Aware Resistive RAM-Based FPGAs
Rizzi, T.; Baroni, A.; Glukhov, A.; Bertozzi, D.; Wenger, C.; Ielmini, D.; Zambelli, C.
dettagli >>
|
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
Vol. 23, No. 3, pp: 328-336, Anno: 2023 |
|
|
|
|
An HPC Pipeline for Calcium Quantification of Aortic Root From Contrast-Enhanced CCT Scans
Minghini, Giada; Cavallo, Armando Ugo; Miola, Andrea; Sisini, Valentina; Calore, Enrico; Fortini, Francesca; Micheloni, Rino; Rizzo, Paola; Schifano, Sebastiano Fabio; Sega, Francesco Vieceli Dalla; Zambelli, Cristian
dettagli >>
|
IEEE ACCESS
Vol. 11, No. 1, pp: 101309-101319, Anno: 2023 |
|
|
|
|
Integrating FPGA Acceleration in the DNAssim Framework for Faster DNA-Based Data Storage Simulations
Marelli, A.; Chiozzi, T.; Battistini, N.; Zuolo, L.; Micheloni, R.; Zambelli, C.
dettagli >>
|
ELECTRONICS
Vol. 12, No. 12, pp: 2621-2639, Anno: 2023 |
|
|
|
|
An energy-efficient in-memory computing architecture for survival data analysis based on resistive switching memories
Baroni, A.; Glukhov, A.; Perez, E.; Wenger, C.; Calore, E.; Schifano, S. F.; Olivo, P.; Ielmini, D.; Zambelli, C.
dettagli >>
|
FRONTIERS IN NEUROSCIENCE
Vol. 16, No. 1, pp: 932270-1-932270-16, Anno: 2022 |
|
|
|
|
In-Memory Principal Component Analysis by Crosspoint Array of Resistive Switching Memory: A new hardware approach for energy-efficient data analysis in edge computing
Mannocci, P.; Baroni, A.; Melacarne, E.; Zambelli, C.; Olivo, P.; Perez, E.; Wenger, C.; Ielmini, D.
dettagli >>
|
IEEE NANOTECHNOLOGY MAGAZINE
Vol. 16, No. 2, pp: 4-13, Anno: 2022 |
|
|
|
|
Low Conductance State Drift Characterization and Mitigation in Resistive Switching Memories (RRAM) for Artificial Neural Networks
Baroni, A.; Glukhov, A.; Perez, E.; Wenger, C.; Ielmini, D.; Olivo, P.; Zambelli, C.
dettagli >>
|
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
Vol. 22, No. 3, pp: 340-347, Anno: 2022 |
|
|
|
|
Investigating 3D NAND Flash Read Disturb Reliability with Extreme Value Analysis
Zambelli, C.; Crippa, L.; Micheloni, R.; Olivo, P.
dettagli >>
|
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
Vol. 21, No. 4, pp: 486-493, Anno: 2021 |
|
|
|
|
Assessing the role of program suspend operation in 3d nand flash based solid state drives
Zambelli, C.; Zuolo, L.; Aldarese, A.; Scommegna, S.; Micheloni, R.; Olivo, P.
dettagli >>
|
ELECTRONICS
Vol. 10, No. 12, pp: 1394-1-1394-18, Anno: 2021 |
|
|
|
|
Editorial for the special issue on flash memory devices
Zambelli, C.; Micheloni, R.
dettagli >>
|
MICROMACHINES
Vol. 12, No. 12, pp: 1566-1-1566-3, Anno: 2021 |
|
|
|
|
A scalable bidimensional randomization scheme for tlc 3d nand flash memories
Favalli, M.; Zambelli, C.; Marelli, A.; Micheloni, R.; Olivo, P.
dettagli >>
|
MICROMACHINES
Vol. 12, No. 7, pp: 759-1-759-14, Anno: 2021 |
|
|
|
|
Accurate Program/Verify Schemes of Resistive Switching Memory (RRAM) for In-Memory Neural Network Circuits
Milo, V.; Glukhov, A.; Perez, E.; Zambelli, C.; Lepri, N.; Mahadevaiah, M. K.; Quesada, E. P. -B.; Olivo, P.; Wenger, C.; Ielmini, D.
dettagli >>
|
IEEE TRANSACTIONS ON ELECTRON DEVICES
Vol. 68, No. 8, pp: 3832-3837, Anno: 2021 |
|
|
|
|
First Evidence of Temporary Read Errors in TLC 3D-NAND Flash Memories Exiting from an Idle State
Zambelli, C.; Micheloni, R.; Scommegna, S.; Olivo, P.
dettagli >>
|
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY
Vol. 8, No. 1, pp: 8956089-99-8956089-104, Anno: 2020 |
|
|
|
|
Mitigating self-heating in solid state drives for industrial internet-of-things edge gateways
Zambelli, C.; Zuolo, L.; Crippa, L.; Micheloni, R.; Olivo, P.
dettagli >>
|
ELECTRONICS
Vol. 9, No. 7, pp: 1179-1-1179-17, Anno: 2020 |
|
|
|
|
Reliability of Logic-in-Memory Circuits in Resistive Memory Arrays
Zanotti, T.; Zambelli, C.; Puglisi, F. M.; Milo, V.; Perez, E.; Mahadevaiah, M. K.; Ossorio, O. G.; Wenger, C.; Pavan, P.; Olivo, P.; Ielmini, D.
dettagli >>
|
IEEE TRANSACTIONS ON ELECTRON DEVICES
Vol. 67, No. 11, pp: 4611-4615, Anno: 2020 |
|
|
|
|
Toward Reliable Multi-Level Operation in RRAM Arrays: Improving Post-Algorithm Stability and Assessing Endurance/Data Retention
Perez, E.; Zambelli, C.; Mahadevaiah, M. K.; Olivo, P.; Wenger, C.
dettagli >>
|
IEEE JOURNAL OF THE ELECTRON DEVICES SOCIETY
Vol. 7, No. 1, pp: 740-747, Anno: 2019 |
|
|
|
|
LDPC Soft Decoding with Improved Performance in 1X-2X MLC and TLC NAND Flash-Based Solid State Drives
Zuolo, L.; Zambelli, C.; Marelli, A.; Micheloni, R.; Olivo, P.
dettagli >>
|
IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING
Vol. 7, No. 3, pp: 507-515, Anno: 2019 |
|
|
|
|
Data retention investigation in Al:HfO 2 -based resistive random access memory arrays by using high-Temperature accelerated tests
Perez, Eduardo; Mahadevaiah, Mamathamba K.; Zambelli, Cristian; Olivo, Piero; Wenger, Christian
dettagli >>
|
JOURNAL OF VACUUM SCIENCE AND TECHNOLOGY. B, NANOTECHNOLOGY & MICROELECTRONICS
Vol. 37, No. 1, pp: 012202-1-012202-5, Anno: 2019 |
|
|
|
|
Resistive RAM endurance: Array-level characterization and correction techniques targeting deep learning applications
Grossi, Alessandro; Vianello, Elisa; Sabry, Mohamed M.; Barlas, Marios; Grenouillet, Laurent; Coignus, Jean; Beigne, Edith; Wu, Tony; Le, Binh Q.; Wootters, Mary K.; Zambelli, Cristian; Nowak, Etienne; Mitra, Subhasish
dettagli >>
|
IEEE TRANSACTIONS ON ELECTRON DEVICES
Vol. 66, No. 3, pp: 1281-1288, Anno: 2019 |
|
|
|
|
Enabling Computational Storage Through FPGA Neural Network Accelerator for Enterprise SSD
Zambelli, C.; Bertaggia, R.; Zuolo, L.; Micheloni, R.; Olivo, P.
dettagli >>
|
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. II, EXPRESS BRIEFS
Vol. 66, No. 10, pp: 1738-1742, Anno: 2019 |
|
|
|